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e180c2b129
The test flags used by driver model are currently not available to other tests. Rather than creating two sets of flags, make these flags generic by changing the DM_ prefix to UT_ and moving them to the test.h header. This will allow adding other test flags without confusion. Signed-off-by: Simon Glass <sjg@chromium.org>
42 lines
1.1 KiB
C
42 lines
1.1 KiB
C
// SPDX-License-Identifier: GPL-2.0+ OR BSD-3-Clause
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/*
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* Copyright (C) 2018, STMicroelectronics - All Rights Reserved
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*/
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#include <common.h>
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#include <dm.h>
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#include <hwspinlock.h>
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#include <asm/state.h>
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#include <asm/test.h>
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#include <dm/test.h>
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#include <test/test.h>
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#include <test/ut.h>
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/* Test that hwspinlock driver functions are called */
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static int dm_test_hwspinlock_base(struct unit_test_state *uts)
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{
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struct sandbox_state *state = state_get_current();
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struct hwspinlock hws;
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ut_assertok(uclass_get_device(UCLASS_HWSPINLOCK, 0, &hws.dev));
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ut_assertnonnull(hws.dev);
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ut_asserteq(false, state->hwspinlock);
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hws.id = 0;
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ut_assertok(hwspinlock_lock_timeout(&hws, 1));
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ut_asserteq(true, state->hwspinlock);
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ut_assertok(hwspinlock_unlock(&hws));
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ut_asserteq(false, state->hwspinlock);
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ut_assertok(hwspinlock_lock_timeout(&hws, 1));
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ut_assertok(!hwspinlock_lock_timeout(&hws, 1));
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ut_assertok(hwspinlock_unlock(&hws));
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ut_assertok(!hwspinlock_unlock(&hws));
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return 0;
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}
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DM_TEST(dm_test_hwspinlock_base, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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