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dm: Provide a function to scan child FDT nodes

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At present only root nodes in the device tree are scanned for devices.
But some devices can have children. For example a SPI bus may have
several children for each of its chip selects.

Add a function which scans subnodes and binds devices for each one. This
can be used for the root node scan also, so change it.

A device can call this function in its bind() or probe() methods to bind
its children.

Signed-off-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Simon Glass
2014-07-23 06:55:18 -06:00
parent 0040b94429
commit 1ca7e2062b
9 changed files with 165 additions and 41 deletions
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6
doc/driver-model/README.txt
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@@ -95,9 +95,13 @@ are provided in test/dm. To run them, try:
You should see something like this:
<...U-Boot banner...>
Running 17 driver model tests
Running 18 driver model tests
Test: dm_test_autobind
Test: dm_test_autoprobe
Test: dm_test_bus_children
Device 'd-test': seq 3 is in use by 'b-test'
Device 'c-test@0': seq 0 is in use by 'a-test'
Device 'c-test@1': seq 1 is in use by 'd-test'
Test: dm_test_children
Test: dm_test_fdt
Device 'd-test': seq 3 is in use by 'b-test'